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Advancing AI-driven Product Defect Detection in Engineering Management: from Fine-Grained Defect Information Extraction to Decision Support and Structured Knowledge Management

AI Research Digest organizes records from OpenAlex API and arXiv API into a static table for transparent comparison. It preserves official source links and dates, marks missing enrichment, and adds deterministic grouping, change, recency, trend, or significance fields only where the documented inputs support them, without recommendations or unsupported claims.

Records
1,000
Last changed
Update schedule
19 9 * * 1 UTC
Coverage
09/04/2026–09/04/2026
Method
Methodology
Title
Advancing AI-driven Product Defect Detection in Engineering Management: from Fine-Grained Defect Information Extraction to Decision Support and Structured Knowledge Management
Record Date
01/01/2031
Vuga Group
Manufacturing Process and Optimization
Change Status
unchanged
Recency Days
0
Research Attention Score
100